CICS 237 Class Visit

Discovery Search

Discovery Search
Find articles across a large number of library resources with just one search! Begin your generalized research here.
Free to use for anyone to find records. Some results, and detailed information such as PDFs and full text links, are available on campus to all, or off-campus to UMass Amherst students, staff and faculty with an UMass Amherst IT NetID (user name) and password.

Search Tips:

Basic search default assumes AND between terms; use " " for phrase searching, or an AND relationship will be assumed.
Try limiting to title or abstract fields to narrow search results.
Use wildcards for truncation: * will look for multiple unspecified characters; ? will look for a single unspecified character.

ACM Digital Library
Journals of the Association for Computing Machinery, its conference proceedings, magazines, technical reports, and more, 1954-present. Includes some works published by affiliated organizations. Covers the fields of computing and information technology.
Available on campus to all, or off-campus to UMass Amherst students, staff and faculty with an UMass Amherst IT NetID (user name) and password.

Search Tips:

Basic search default assumes AND between terms; use " " for phrase searching, or an AND relationship will be assumed.
Advanced search default assumes AND between "Search Within" fields as well as AND within "Search Within" fields.
Use the "Edit Query" option in advanced search to specify different combinations of terms (AND/OR/NOT).
Use wildcards for truncation: * will look for multiple unspecified characters; ? will look for a single unspecified character.

IEEE Xplore
All IEEE journals (including Spectrum), standards, transactions, and major conference proceedings since 1988, plus some content since 1952, to present.
Available on campus to all, or off-campus to UMass Amherst students, staff and faculty with an UMass Amherst IT NetID (user name) and password. As of May 2022, IEEE no longer supports Internet Explorer, please use another browser for the best experience.

Search Tips:

There are 4 types of search functions in IEEE Xplore: Global, Advanced, Command, and Citation. Use Global and Advanced for keyword searching.
Global (default) search assumes AND between terms; use " " for phrase searching, or an AND relationship will be assumed.
Advance Search can use AND/OR/NOT between and within search fields.
Use wildcards for truncation: * will look for multiple unspecified characters at the end, beginning, or middle of a word; ? will look for a single unspecified character. Terms must have at least 3 characters to use wildcards.
Search within results to narrow your results set.